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Introduction
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X-ray Diffraction (XRD)
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Basic Theory: Instrument Design
Answer: Diffraction occurs at all the angles of 2q simultaneously in powder samples. In order to obtain a diffraction pattern, the detector (in most designs) rotates to various 2q angles to measure diffraction from the sample. Below is a schematic diagram for a powder X-ray diffractometer, showing the rotating detector.
The source shown is an X-ray tube, which is the most common source of X-rays. Filters are used to provide a narrow wavelength range for analysis.
Question:
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Celeste Morris, Bradley Sieve and Heather Bullen, Department of Chemistry, Northern Kentucky University, Highland Heights, KY 41099 |